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Crystallography and Crystal Defects

eBook
ISBN/EAN: 9781119420163
Umbreit-Nr.: 9024944

Sprache: Englisch
Umfang: 584 S., 35.12 MB
Format in cm:
Einband: Keine Angabe

Erschienen am 06.04.2020
Auflage: 3/2020


E-Book
Format: EPUB
DRM: Adobe DRM
€ 71,99
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  • Zusatztext
    • <p><b>The classic book that presents a unified approach to crystallography and the defects found within crystals, revised and updated</b></p><p>This new edition of<i>Crystallography and Crystal Defects</i> explains the modern concepts of crystallography in a clear, succinct manner and shows how to apply these concepts in the analyses of point, line and planar defects in crystalline materials.</p><p>Fully revised and updated, this book now includes:</p><ul><li>Original source references to key crystallographic terms familiar to materials scientists</li><li>Expanded discussion on the elasticity of cubic materials</li><li>New content on texture that contains more detail on Euler angles, orientation distribution functions and an expanded discussion on examples of textures in engineering materials</li><li>Additional content on dislocations in materials of symmetry lower than cubic</li><li>An expanded discussion of twinning which includes the description and classification of growth twins</li><li>The inclusion and explanation of results from atomistic modelling of twin boundaries</li><li>Problem sets with new questions, detailed worked solutions, supplementary lecture material and online computer programs for crystallographic calculations.</li></ul><p>Written by authors with extensive lecturing experience at undergraduate level,<i>Crystallography and Crystal Defects, Third Edition</i> continues to take its place as the core text on the topic and provides the essential resource for students and researchers in metallurgy, materials science, physics, chemistry, electrical, civil and mechanical engineering.</p>

  • Kurztext
    • The classic book that presents a unified approach to crystallography and the defects found within crystals, revised and updated This new edition of Crystallography and Crystal Defects explains the modern concepts of crystallography in a clear, succinct manner and shows how to apply these concepts in the analyses of point, line and planar defects in crystalline materials.&nbsp; Fully revised and updated, this book now includes: Original source references to key crystallographic terms familiar to materials scientists Expanded discussion on the elasticity of cubic materials New content on texture that contains more detail on Euler angles, orientation distribution functions and an expanded discussion on examples of textures in engineering materials Additional content on dislocations in materials of symmetry lower than cubic An expanded discussion of twinning which includes the description and classification of growth twins The inclusion and explanation of results from atomistic modelling of twin boundaries Problem sets with new questions, detailed worked solutions, supplementary lecture material and online computer programs for crystallographic calculations. Written by authors with extensive lecturing experience at undergraduate level, Crystallography and Crystal Defects, Third Edition continues to take its place as the core text on the topic and provides the essential resource for students and researchers in metallurgy, materials science, physics, chemistry, electrical, civil and mechanical engineering.

  • Autorenportrait
    • <p><b>Anthony Kelly</b> was a Founding Fellow of Churchill College, Cambridge and Director of Studies in Natural Sciences at the College. He also worked at the National Physical Laboratory and Imperial Chemical Industries before becoming Vice-Chancellor of Surrey University, UK. Professor Kelly returned to Cambridge as a Fellow of Churchill College in 1994.<p><b>Kevin M. Knowles</b> is a Fellow of Churchill College, Cambridge and a former Director of Studies in Natural Sciences at the College. He is also a Senior University Lecturer in the Department of Materials Science and Metallurgy at Cambridge University, UK.
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