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Zusatztext
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InhaltsangabeThe Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
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Autorenportrait
- InhaltsangabeThe Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
Detailansicht
Scanning Probe Microscopy
Atomic Scale Engineering by Forces and Currents, NanoScience and Technology
ISBN/EAN: 9780387400907
Umbreit-Nr.: 1625191
Sprache:
Englisch
Umfang: xiv, 282 S., 157 s/w Illustr.
Format in cm:
Einband:
gebundenes Buch
Erschienen am 28.06.2006
Auflage: 1/2006