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This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.

This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects.  The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain.  Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization.  Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.    Provides a comprehensive guide to the challenges and solutions for the testing of TSVbased 3D stacked ICs;  Includes indepth explanation of key test and designfortest technologies, emerging standards, and test architecture and testschedule optimizations;  Encompasses all aspects of test as related to 3D ICs, including prebond and postbond test as well as the test optimization and scheduling necessary to ensure that 3D testing remains costeffective.